X-rays refer to electromagnetic radiation with wavelengths ranging from 0.01 to 10 nm, and each element’s atom has its own characteristic X-ray spectral line.

In an XRF analyzer, a controlled X-ray source emits X-rays to irradiate the object being measured. A portion of the shell electrons of the atoms generate stimulated radiation, releasing X-ray fluorescent photons that characterize the characteristics of the element. The X-ray fluorescent photons are captured by the detector to generate electrical signals, which are amplified, filtered, AD converted, and digitally processed to form spectral information. The spectral information is processed by a specific algorithm to calculate the concentration of the element.